NanoMesureFrance WEBINAR

NanoMesureFrance Association

Multi-technique and multi-scale approach of materials and devices by electron spectroscopies

Institut Lavoisier de Versailles is a joint research unit between CNRS and Université de Versailles-Saint-Quentin-en-Yvelines (ILV, UMR CNRS-UVSQ 8180). ILV is characterized by its multidisciplinary, exploring diverse themes of the chemistry, ranging from molecular or porous materials, to synthetic organic chemistry, via interfacial electrochemistry. ILV is structured into 3 research teams associated with technical a platform (PASTEL) for NMR, XRD or mass spectrometry. The key words of the laboratory are: synthesis, properties and analysis. The EPI team, partner of NanoMesureFrance, carries out fundamental and applicative research activities relying on electrochemistry and electron spectroscopies to deeply investigate the physico-chemistry of surfaces and interfaces of materials and devices finding applications in various fields such as micro or opto-electronics, semiconductors, photovoltaic, energy, corrosion, pharmaceutical or cultural heritage. EPI team has thus a diversified collaborative network, with academic, EPIC and industrial partners. A surface analysis center (CEFS2), gathering state-of-the-art lab-based equipment for electron spectroscopies, is connected to the EPI research group.Thanks to their versatility, electron spectroscopies can be employed in many fields of applications. This webinar proposes to showcase capabilities of X-ray photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES) / Scanning Auger Microscopy (SAM), Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS) used separately and in a complementary manner. Indeed, by using a multi-technique approach, a complete and reliable description ranging from microstructure to morphology and chemistry is obtained. Access to surface elemental composition, chemical environments or more physical information such as workfunction or density of states provides a global understanding of the issues we must address. These techniques also cover spatial resolutions from millimetre to tens of nanometers providing information at different scales (laterally or in-depth). The importance of sample preparation and consideration of measurement artefact will also be addressed in terms of data reliability and consistency of the analysis sequences.

NanoMesureFrance WEBINAR

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NanoMesureFrance WEBINAR

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